Published On: December 10, 2023

DALL-E In the fast-paced world of semiconductor product development, two metrics stand out as pivotal to the success and efficiency of manufacturing: yield and test time. Yield, the percentage of functional chips in a production batch, directly influences the cost-effectiveness and viability of semiconductor products. Simultaneously, test time, the duration spent verifying the functionality and reliability of these chips, plays a crucial role in determining the throughput and overall efficiency of the production process. Thus, it is essential to understand the intricacies of yield and test time in semiconductor manufacturing, exploring their significance, challenges, and the vital skills required to optimize these critical factors. Yield In Semiconductor Product Development: Yield refers to the proportion of functional chips produced from a batch in semiconductor manufacturing. It’s a critical […]