The Semiconductor Metrology
DALL-E What Is Semiconductor Metrology Semiconductor Metrology is the science and technology of measurement explicitly applied to semiconductor manufacturing processes. It encompasses the tools, techniques, and methodologies used to measure and analyze various aspects of semiconductor materials, components, and devices. The primary goal is to ensure that chips meet stringent design and performance specifications. Below are the key aspects of semiconductor metrology: Key Aspects Description Dimensional Measurements Precise measurements of nanoscale features, such as line widths, spaces, and pattern dimensions on wafers. Material Characterization Assessing the chemical composition, thickness, and uniformity of films and materials used in semiconductor fabrication. Defect Detection Identifying and analyzing defects on wafers or during the manufacturing process, critical for improving yield. Critical Dimension (CD) Control Monitoring and ensuring that the dimensions of […]
