The Semiconductor Thermography Data
DALL-E Fundamental Concepts of Semiconductor Thermography Semiconductor thermography is a non-destructive measurement technique that quantifies and visualizes temperature variations within semiconductor devices, particularly Integrated Circuits (ICs). It primarily operates by detecting infrared (IR) emissions or other temperature-dependent physical changes at the device’s surface, allowing precise characterization of thermal behaviors. Thermography produces detailed thermal maps, accurately depicting temperature gradients, localized hotspots, and thermal anomalies undetectable by conventional electrical testing methods. These thermal maps are essential for identifying device areas experiencing elevated temperatures due to resistive losses (Joule heating), transistor switching activities, or leakage currents at advanced technology nodes. A critical parameter determined through thermography is the junction temperature (Tj), precisely the temperature at the semiconductor transistor junction level. Elevated junction temperatures directly reduce carrier mobility, negatively impacting transistor […]
