- Hosted By: D Y Patil International University
- Location: Pune, Maharashtra, India (Virtual)
- Date: 19th/20th December 2024
Semiconductor Yield And Testing
- | Published On:
Chetan Arvind Patil
Hi, I am Chetan Arvind Patil (chay-tun – how to pronounce), a semiconductor professional whose job is turning data into products for the semiconductor industry that powers billions of devices around the world. And while I like what I do, I also enjoy biking, working on few ideas, apart from writing, and talking about interesting developments in hardware, software, semiconductor and technology.
COPYRIGHT
2025
, CHETAN ARVIND PATIL
This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License. In other words, share generously but provide attribution.
DISCLAIMER
Opinions expressed here are my own and may not reflect those of others. Unless I am quoting someone, they are just my own views.
RECENT POSTS
DALL-E The Rise Of Open-Source Semiconductor Design Traditionally, semiconductor design has been a highly proprietary field dominated by closed
DALL-E The AI Debate Artificial Intelligence (AI) often sparks divided opinions as a groundbreaking innovation or technological hype. At
DALL-E Fundamental Concepts of Semiconductor Thermography Semiconductor thermography is a non-destructive measurement technique that quantifies and visualizes temperature variations
DALL-E Simulation In Semiconductor Development The semiconductor industry constantly evolves, increasing design complexity and high manufacturing costs. Traditional methods
DALL-E Semiconductor Reliability Matters The semiconductor industry thrives on precision, performance, and longevity, from microcontrollers to processors, semiconductors power
